PIXE, Particel Induced X-Ray Emission A Concise Review

A. İnhan GARİP

Article Details

PIXE, Particel Induced X-Ray Emission A Concise Review

Authors:

A. İnhan GARİP

Publisher:

TUBITAK

Journal:

Turkish Journal of Chemistry 1998 Vol.22 Issue 3, pp.183-200

Document Type:

Article

Publication Date:

2/1998

Document Language:

Turkish

Document ID (Org No.):

2000730567

Frequency:

Bimonthly

eISSN:

1303-6130

pISSN:

1300-0527

Abstract:

 

PIXE-Particle Induced X-Ray Emission is a multielemental, sensitive and non-estructive method which has been in use in trace elemental analysis since 1970. This review aims to explain the main features of PIXE. References will be given at the end for those that seek more detailed knowledge on the principles and applications of this technique.

 

PIXE-Particle Induced X-Ray Emission is a multielemental, sensitive and non-estructive method which has been in use in trace elemental analysis since 1970. This review aims to explain the main features of PIXE. References will be given at the end for those that seek more detailed knowledge on the principles and applications of this technique.

Article Details

PIXE, Particel Induced X-Ray Emission A Concise Review

Authors: A. İnhan GARİP

Publisher: TUBITAK

Journal: Turkish Journal of Chemistry 1998 Vol.22 Issue 3, pp.183-200

Document Type: Article

Publication Date: 2/1998

Document Language: Turkish

Document ID (Org No.): 2000730567

Frequency: Bimonthly

eISSN: 1303-6130

pISSN: 1300-0527

Issues

Authors:

A. İnhan GARİP

Publisher:

TUBITAK

Journal:

Turkish Journal of Chemistry 1998 Vol.22 Issue 3, pp.183-200

Document Type:

Article

Publication Date:

2/1998

Document Language:

Turkish

Document ID (Org No.):

2000730567

Frequency:

Bimonthly

eISSN:

1303-6130

pISSN:

1300-0527