Effect of the Thickness and Annealing Temperature on the Structural Properties of Thin CdS Films Prepared by Thermal Evaporation

Muhammad A. Al-Aani

Article Details

Effect of the Thickness and Annealing Temperature on the Structural Properties of Thin CdS Films Prepared by Thermal Evaporation

Authors:

Muhammad A. Al-Aani

Publisher:

University of Baghdad

Journal:

Iraqi Journal of Physics Vol.8 Issue 11, pp.1-7

Document Type:

Article

Publication Date:

1/2010

Document Language:

English

Document ID (Org No.):

2001368617

pISSN:

2664-5548

Keywords:

CdS Structural Properties

Abstract:

 A thin CdS Films have been evaporated by thermal evaporation technique with different thicknesses (500, 1000, 1500 and 2000Å) and different duration times of annealing (60, 120 180 minutes) under 573 K annealing temperature, the vacuum was about 8 × 10-5 mbar and substrate temperature was 423 K. The structural properties of the films have been studied by X- ray diffraction technique (XRD). The crystal growth became stronger and more oriented as the film thickness (T) and duration time of annealing ( Ta) increases.

Article Details

Effect of the Thickness and Annealing Temperature on the Structural Properties of Thin CdS Films Prepared by Thermal Evaporation

Authors: Muhammad A. Al-Aani

Publisher: University of Baghdad

Journal: Iraqi Journal of Physics Vol.8 Issue 11, pp.1-7

Document Type: Article

Publication Date: 1/2010

Document Language: English

Document ID (Org No.): 2001368617

pISSN: 2664-5548

CdS Structural Properties

Issues

Authors:

Muhammad A. Al-Aani

Publisher:

University of Baghdad

Journal:

Iraqi Journal of Physics Vol.8 Issue 11, pp.1-7

Document Type:

Article

Publication Date:

1/2010

Document Language:

English

Document ID (Org No.):

2001368617

pISSN:

2664-5548