Empirical mode decomposition application for short-term flicker severity

YASEMİN ÖNAL; ÖMER NEZİH GEREK; DOĞAN GÖKHAN ECE

Article Details

Empirical mode decomposition application for short-term flicker severity

Authors:

YASEMİN ÖNAL | ÖMER NEZİH GEREK | DOĞAN GÖKHAN ECE

Publisher:

TUBITAK

Journal:

Turkish Journal of Electrical Engineering and Computer Science 2016 Vol.24 Issue 2, pp.499-509

Document Type:

Article

Publication Date:

3/2016

Document Language:

Turkish

Document ID (Org No.):

2000742238

Frequency:

Bimonthly

eISSN:

1303-6203

pISSN:

1300-0632

Abstract:

 

In this article, an approach based on empirical mode decomposition (EMD) is suggested in order to calculate short-term flicker severity, Pst, in power systems. EMD is a new signal processing method used for the analysis of nonlinear and nonstationary signals. Pst is an important quantity in the electric power quality index defined by the International Electrotechnical Commission. In the suggested approach, the voltage signal is separated into intrinsic mode function components using EMD. These components are used for calculating the voltage flicker amplitude and frequency, and Pst is calculated as a result of the statistical evaluation of flicker amplitude. EMD is thought to be efficient in finding the flickers and calculating Pst due to power to find the changes in the oscillating signal envelope of EMD. Simulations are made using an input signal modulated with single and multiflicker frequency. Simulations show that the approach is usable in the calculation of Pst and it gives good results.

Article Details

Empirical mode decomposition application for short-term flicker severity

Authors: YASEMİN ÖNAL | ÖMER NEZİH GEREK | DOĞAN GÖKHAN ECE

Publisher: TUBITAK

Journal: Turkish Journal of Electrical Engineering and Computer Science 2016 Vol.24 Issue 2, pp.499-509

Document Type: Article

Publication Date: 3/2016

Document Language: Turkish

Document ID (Org No.): 2000742238

Frequency: Bimonthly

eISSN: 1303-6203

pISSN: 1300-0632

Issues

Authors:

YASEMİN ÖNAL | ÖMER NEZİH GEREK | DOĞAN GÖKHAN ECE

Publisher:

TUBITAK

Journal:

Turkish Journal of Electrical Engineering and Computer Science 2016 Vol.24 Issue 2, pp.499-509

Document Type:

Article

Publication Date:

3/2016

Document Language:

Turkish

Document ID (Org No.):

2000742238

Frequency:

Bimonthly

eISSN:

1303-6203

pISSN:

1300-0632